Radiation Testing

TAU eSEE

Setting the Standard for Single Event Effects Testing

Challenge

Meeting the demand for high LET testing, TAU eSEE offers ultrafast electron beams for reliable testing with independently tunable LET and high penetration depth.

Solution

Precise control of beam size and position allows for testing with unprecedented lateral resolution to identify SEE-induced failure sites in bespoke and COTS devices.


Experience the benefits of TAU eSEE firsthand and accelerate your design cycles by reserving beamtime at TAU Labs in Carlsbad, CA, or get the system for your own facility.

Relativistic electron bunches are the preferable alternative to ions

Ultrafast electrons are accelerated with TAU's compact laser-powered accelerator

The Linear Energy Transfer (LET) is proportional to the electron bunch charge

The depth of testing inside the device is proportional to the electron kinetic energy

Reserve Your Beamtime @ TAU Labs

Radiation Testing
Faster, easier, compact & affordable

Reserve beamtime at TAU Labs.
Order the system for your facility.

features

No long wait times

TAU eSEE gives you immediate access to beamtime when your projects demand it, eliminating the long wait times typical at traditional test facilities.

Lower overall costs

TAU eSEE is a cost-effective solution for radiation testing of COTS or bespoke parts by leveraging compact laser-powered electron accelerators.

Compact & flexible

TAU eSEE is a compact and flexible platform that easily integrates into existing infrastructure to support SEE testing at your facility.

Beamtime close to you –
or in your own facility

TAU Labs is conveniently located between Los Angeles and San Diego. For even greater convenience, bring the unique, cutting edge technology to your own facility.

Ultrafast electrons give access to high LET and penetration depth
Parameters
  • LET Tunable up to 50 MeV-cm2/mg
  • Range 100 μm in Si
  • Range (Phase 2) 1 mm in Si
  • Electron Energy Up to 70 MeV
  • Electron Energy (Phase 2) > 1 GeV
  • Beam Size Down to 1 μm (diam.)
  • Exposure Rate 100 Hz
Use Cases
  • Pre-screening: Identify potential failures on an accelerated timeline
  • Post-screening: Precisely locate problem circuits leading to SEUs
  • HI alternative: Test devices for non-government applications
  • When pulsed lasers fail: Penetrate through front-side metal layers and have confidence in your LET
Continuous developments underway, specifications subject to change without notice | © 07-2026